Next Generation Electron Microscopy Technology and Applications

Sponsored by FEI Thermo Fisher Scientific

Thursday, September 21, 2017

34-401A, Grier Room A

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Agenda

9:00am Coffee and Registration
9:30

Introduction: Dr. Vladimir Bulovic, Associate Dean for Innovation, MIT.nano

9:45

Advances in Detection and Resolution in Scanning Electron Microscopy

Brandon Van Leer, Thermo Fisher Scientific

10:30

Helios G4: Pushing the Limits of TEM Sample Preparation and 3D Characterization

Brandon Van Leer, Thermo Fisher Scientific
Introduction by Professor Ju Li, Battelle Energy Alliance Professor of Nuclear Science and Engineering, Professor of Materials Science and Engineering

11:15

Recent technological developments in cryo-EM: Advancing challenging structural biology research problems

Dr. Jeffrey Lengyel, Thermo Fisher Scientific
Introduction by Professor Thomas Schwartz, Boris Magasanik Professor of Biology

12:00 Lunch and networking
1:00

Li ion battery material research workflow: visualization from atoms to millimeters

Brandon Van Leer, Thermo Fisher Scientific

1:45

Using modern TEM systems to optimize imaging and analysis of dose sensitive samples

Dr. Jan Ringnalda, Thermo Fisher Scientific
Introduction by Akshay Agarwal, Department of Electrical Engineering and Computer Science

2:30

Extending Focused Ion Beam Applications with the Xe+ Plasma FIB

Brandon Van Leer, Thermo Fisher Scientific

3:00

Maximizing the efficiency of detectors for imaging and analysis in state-of-the-art STEM systems.

Dr. Jan Ringnalda, Thermo Fisher Scientific

3:30

Vibration isolation solution strategies for high performance microscopes

Michael Georgalis, TMC Corporation

4:00 Wrap up and scheduling individual meetings with FEI scientists for further discussion

 

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