Sponsored by Ametek
Thursday, January 25, 2018
34-401A, Grier Room A
50 Vassar Street, Cambridge, MA
Agenda
| 9:30 AM | Coffee and Registration sponsored by TMC |
| 9:45 | Introduction Dennis Grimard, Ph.D, Managing Director, MIT.nano, School of Engineering, MIT |
| 10:00 | High-Speed Performance Metrics with SEM based EDS Silicon Drift Detector Technology Tara Nylese, Global Applications Manager, EDAX |
| 10:30 | Advanced Applications of Modern SDDs Tara Nylese, Global Applications Manager, EDAX |
| 11:00 | Improved Sensitivities For Trace Element Analysis by Electrothermal Vaporization Inductively Coupled Optical Emission Spectroscopy Dr. Michael DeLeon, Applications Department Manager - NAFTA Regional Product Manager – Stationary and Mobile Metal Analyzers, SPECTRO Olaf Schulz, Product Manager ICP, SPECTRO |
| 12:00 PM | Lunch and Networking sponsored by TMC |
| 1:00 | Nanoscale Metrology for Optical Surface Testing, 3D Microscopy, and Precision Stage Positioning Dr. Peter de Groot, Executive Director of R&D, ZYGO Dr. Vivek Badami, Senior Innovations Scientist, ZYGO |
| 2:00 | Novel Applications of NanoSIMS and Atom Probe Tomography Dr. Hugues Francois-Saint-Cyr, Applications Scientist Atom Probe, CAMECA |
| 3:00 | Mitigation of Vibration, Magnetic Field, and Acoustic Effects for SEM, TEM, NMR and E-Beam Lithography Applications Michael Georgalis, Senior Sales Engineer, TMC |
| 3:45 | Wrap up and scheduling individual meetings for further discussion |