MIT.nano job opportunity: Program engineer — metrology / characterization

Position Overview

MIT.nano seeks a highly skilled Program Engineer to support the Technical Concierge Service of the Northeast Microelectronics Coalition (NEMC) Hub. This role combines expert-level technical matchmaking, cross-facility coordination, and hands-on microfabrication and characterization work. The position will help translate early-stage concepts into manufacturable processes by connecting users with the most appropriate facilities, expertise, and resources across the regional microelectronics ecosystem.

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The position serves as a key interface between academic researchers, industry partners, government organizations, and startups, ensuring efficient Lab-to-Fab translation and plays a critical role in strengthening the regional microelectronics ecosystem, enabling researchers and innovators to rapidly access the infrastructure and expertise required to move ideas from concept to manufacturing.

  • Provide hands-on technical support in materials and device characterization, microfabrication, materials processing, device prototyping, and quantitative metrology, both independently and on behalf of users.
  • Guide users in the selection, execution, and interpretation of characterization and metrology techniques, including electrical, structural, chemical, and surface analysis methods.
  • Facilitate cross-facility coordination, including scheduling of specialized metrology tools, and alignment of project workflows spanning fabrication and characterization stages.
  • Assist users in translating laboratory concepts into scalable fabrication and measurement-informed process flows, ensuring appropriate in-line and end-of-line metrology integration.
  • Develop and maintain documentation, measurement protocols, process guidelines, and best practices for shared facility use, including benchmarking against academic, industry, and national lab standards to promote data quality, reproducibility, and traceability.
  • Develop and maintain workflows, SOPs, and best-practice content with emphasis on metrology standards, calibration procedures, and uncertainty quantification.
  • Support outreach efforts that expand access to advanced microelectronics infrastructure, including education on characterization capabilities and data interpretation for new external users and emerging technology teams.
  • Track project outcomes and contribute to reporting, including metrics on device performance, measurement quality, and process-to-characterization correlations, supporting continuous improvement of the Technical Concierge program.
  • Foster collaboration among MIT.nano staff, partner facilities, and the broader NEMC network, particularly in harmonizing characterization methodologies and data standards.
  • Travel between regional facilities in the NEMC network to support on-site characterization, tool benchmarking, and metrology alignment efforts.

Minimum Required Education and Experience

  • BSc in electrical engineering, materials science, applied physics, microelectronics, or a related field.
  • Minimum 7 years of related experience in a research environment (including graduate student experience).
  • Demonstrated experience with materials and device characterization techniques, such as electrical measurements (IV/CV), microscopy (SEM, AFM), spectroscopy (e.g., XPS, Raman), or thin-film/materials analysis.
  • Strong understanding of metrology principles, including calibration, measurement uncertainty, repeatability, and data integrity.
  • Strong ability to evaluate technical problems and propose practical experimental, fabrication, and measurement-driven validation pathways.
  • Excellent communication skills and ability to work with multidisciplinary teams across academia and industry.

Preferred Education and Experience

  • PhD in a related field.
  • Experience working in shared research facilities or user laboratories.
  • Experience developing SOPs or training materials, metrology protocols and documentation standards.
  • Experience correlating process parameters with characterization data and device performance metrics.
  • Knowledge of regional and national microelectronics infrastructure networks.

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