The Challenges of Acquiring Atomic-Scale Information at Cryogenic Temperatures in the Transmission Electron Microscope
WHERE AND WHEN
Thursday, September 17, 2020
11 am – 1 pm EST
Attendees can join and participate via Zoom.
Meeting ID: 945 8610 0937
High stability is essential for acquiring atomic-scale information by transmission electron microscopy (TEM). This is especially true in the case with materials that are conducive to cooling. Recent advances in TEM holder designs have made the task of characterizing materials on the atomic scale while cooling a reality. This tool talk will review some of the challenges of acquiring stable and repeatable results and introduce the new MEL-BUILD Double tilt LN2 ATMOS Defend Holder. This newly designed Double Tilt LN2 TEM holder incorporates a specially designed vacuum transfer system and mechanical drift cancellation system. Practical results will be shared and reviewed with the audience.