Join us for the June Characterization User Forum focused on transmission electron microscopy.
DATE: Wednesday, June 11, 2025
TIME: 4:00 p.m. — 5:00 p.m. ET
LOCATION: 12-0168 (MIT.nano basement teaching space)
- Get to know your Characterization community.
- Bring questions about your data.
- Share your feedback in a user-led town hall.
- Stay up-to-date with facility news.
- Food and drink will be provided.
Each user forum also includes a spotlight talk by a graduate student. The June forum will feature:
Characterizing Defects in Epitaxial GaAs on Silicon via Focused Ion Beam Sample Preparation
Speaker
Chen Chang, Graduate Student
Materials Science and Engineering, MIT
Abstract
Integrating III-V materials with silicon is challenging due to lattice mismatch and the resulting interfacial defects. Chen’s team is working towards defect-free GaAs on Si through nanopatterning. He focuses on characterizing the structure using transmission electron microscopy (TEM). In this talk, he will discuss focused ion beam (FIB) techniques for cross-sectional and plan-view TEM sample preparation, highlighting strategies to enable reliable analysis.
Biography
Chen is a first-year PhD student in DMSE, co-advised by Prof. Frances Ross and Prof. Jeehwan Kim. He is interested in epitaxial growth and electron microscopy.