Next Generation Instrumentation for Nanoscale Research using AFM, nanoIR, XRD, XRF, X-ray uCT, EDS, EBSD, NanoIndentation, and Fluorescence Microscopy

Sponsored by Bruker

Wednesday, May 2, 2018
6-104, Chipman Room
182 Memorial Drive (Rear)
Cambridge, MA
9:30am-3:30pm

Register

Agenda

9:30-9:40

Welcome to Bruker Technical Tool Talks

9:40–10:40

New AFM Modes for New Research - 2D, Functional, and Energy Materials

10:40–11:00

Extending Infrared Spectroscopy to the Nanoscale - From Sub-10nm Chemical Identification to Nano-photonics Research

11:00–11:10

Break

11:10–11:40

Nanoindentation: In Operando Materials Mechanics from Fundamentals to Performance

11:40–12:20

Advanced Fluorescence Microscopy - 3D Super-resolution, SPIM, Swept-field Confocal and Multiphoton with Optical Holography for Life Science

12:20-1:20

Lunch

1:20-2:30

Enabling Technologies: State-of-the-art and Next-Generation X-ray Sources and Detectors

2:30-3:10

X-ray Techniques for the Characterization of Nanomaterial Morphology: XRD, XRR, SAXS, nanoCT, CDI, Holography, PCS, XAS

3:10-3:30

X-ray Techniques for the Characterization of Nanomaterial Composition: µXRF, EDS

3:30-

Adjourn