Advances in Scanning Microwave Impedance Microscopy
WHERE AND WHEN
Thursday, May 13, 2021
11 am – 12 pm EDT
Presented by Dr. Ravi Chintala & Dr. Yongliang Yang
Scanning Microwave Impedance Microscopy (sMIM) is a near-field scanning probe microscopy technique where a customized microwave AFM cantilever probe is used to measure the electrical properties of materials at the nanoscale. Microwave signals are sent through an AFM cantilever and the reflected signal is collected. The reflected microwave signal is a measure of the impedance of the sample underneath the AFM tip.
sMIM provides images of the variations in local capacitance and conductance with nanoscale resolution, making it an excellent method for characterizing a wide range of materials such as semiconductors, insulators, 1D/2D, ferroelectric materials, and more. A great deal of cutting-edge physical investigations concerning fundamental mechanisms frequently involve electrical measurements at low temperature and high magnetic fields. LT, mK, and UHV ScanWave™ systems are low temperature sMIM turnkey solutions for frontier research in physics (quantum effects, phase transitions, etc.) and novel material studies (topological insulators, ferroelectrics, manganates, etc.), enabling electrical characterization of materials at ultra-low temperatures and high magnetic fields.
In this talk, PrimeNano will present ScanWave™ technology and review the state of the art in sMIM applications and case studies at room temperature and cryogenic temperatures, showing the versatile applicability of sMIM.
Ravi Chintala is currently working as an Applications Scientist at PrimeNano Inc. Dr. Chintala has more than 10 years of research experience in scanning probe microscopy, focusing specifically on various electrical SPM techniques. Before joining PrimeNano, Dr. Chintala was a postdoctoral fellow at Lawrence Berkeley National Laboratory investigating nanoscale charge carrier dynamics of solar cells using KPFM. Dr. Chintala has obtained his PhD from IMEC (Belgium) and MS from Michigan Technological University (Houghton, MI).
Yongliang Yang is currently responsible for the low temperature sMIM system development at PrimeNano Inc. Dr. Yang has more than 10 years of research and development experiences in scanning microwave impedance microscopy technology and MEMS research. Before he joined PrimeNano in 2014 as a research & development scientist, he was a postdoc at Stanford University, developing scanning microwave impedance microscopy (sMIM) technology and studying electrical properties of materials with sMIM. Dr. Yang has a BS degree from Peking University and a PhD from Chinese Academic of Sciences. He is the inventor of four patents and the author of over 40 publications.