Zeiss tool talk: Frontiers in 3D imaging & characterization with X-ray microscopy—Apr. 5


DATE: Tuesday, April 5, 2022
TIME: 11 a.m. – 12:30 p.m. EDT
SPEAKER: Will Harris, Ph.D, Product Marketing Manager—Materials Science, ZEISS Research Microscopy Solutions 
LOCATION: Zoom: mit.zoom.us/j/94586100937



In recent years, X-ray microscopy (XRM) has grown out of origins at synchrotron facilities by incorporating magnifying optics, setting new benchmarks in high resolution nondestructive 3D characterization. Since then, capabilities have expanded further to include improved performance not only in resolving power, but also an increasing array of contrast modalities and advanced data processing approaches. For the microscopist and scientist, access to such technology in the home laboratory opens the door for exciting new investigations into connections between three-dimensional structure and properties/performance of materials and devices.

This talk will present a brief introduction to the X-ray technology behind the ZEISS Xradia Versa at MIT.nano, followed by a selection of examples where 3D XRM has provided unique insight to applications in materials science, engineering, biomaterials, electronic devices, and geoscience.