New Tool: Zeiss MicroCT

The new microCT from Zeiss (0.5 um resolution!) is up and running at MIT.nano.

The ZEISS Xradia Versa 620 can non-destructively characterize the 3D microstructure of materials under controlled perturbations (in situ), and observe the evolution of structures over time (4D). By leveraging resolution at a distance, the Xradia Versa maintains the highest resolution across large working distances, accommodating both sample, environmental chamber, and high precision in-situ load rigs without sacrificing resolution. 

Training starts March 15. Sign up: