Raith and MIT.nano will bring our VELION FIB-SEM user community together in a hybrid in-person / online event on Friday, December 3 from 10 AM – 12:30 PM ET.
Join this user meeting to learn the latest news on the VELION product and applications, and hear about nanofabrication challenges and achievements from invited speakers. The technical session, restricted to current VELION users, will focus on technical and customer support. Users will have the opportunity to directly raise and discuss any issues related to operating the Raith VELION on a daily basis, as well as share experiences and best practices with colleagues.
To join this event, contact Rainer Schmid at Raith.Schmid@raithamerica.com.
Agenda
9:00 AM: Pre-meeting breakfast for presenters and in-person attendees
10:00 AM: Raith VELION update by Torsten Richter, VELION Product Manager
10:20 AM: Short user presentations:
Atomic-resolution characterization of electrochemical interfaces in battery electrodes
Kent Zheng | MIT.nano (Prof. Joseph Checkelsky group)
Defect engineering of 2D van der Waals materials for the tailored nucleation of metal nanoislands
Kate Reidy, Vera Zarubin | MIT.nano (Prof. Frances Ross group)
Raith VELION @ UCSB: Initial applications for FIB nanofabrication
Dan Read, PhD | UC Santa Barbara
Ion beam lithography for coherent X-ray beam shaping and imaging
Kahraman Keskinbora | MIT.nano (Prof. Riccardo Comin group)
Substrate patterning using VELION
Tingyu Su | MIT.nano (Prof. Caroline Ross group)
Raith VELION @ Sandia National Lab: VELION for special FIB applications
Michael Titze, PhD | Sandia National Lab
X-ray imaging with nanophotonic scintillators
Charles Roques-Carmes | MIT.nano (Prof. Marin Soljacic group)
Precise array of quantum emitters
Sophia Duan | MIT.nano (Prof. Dirk Englund group)
12:00 PM: Technical session (restricted to users with VELION experience).
1:30 PM: Networking lunch for Raith presenters and VELION users