Join MIT.nano for a tool talk with In-Situ Microscopy Solutions
12-0168 (MIT.nano basement)
Workshop Schedule:
09:00 - 09.45 Registration and Coffee
09:45 - 10:00 Introduction of the In-situ Microscopy Alliance (IMA)
10:00 - 10:30 Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis
10:30 - 11:00 Mechanics of architected materials through the lens of in situ characterization, Prof. Carlos Portela, MIT
11:00 - 11:15 Break and networking
11:15 - 11:45 Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies
11:45 - 12:15 Metal layers short localization with EBAC and FIB circuit modifications, Mr. Karl Boche
12:15 - 13:30 Lunch (Provided by In Situ Microscopy Alliance)
13:30 - 14:00 AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Dr. Jan Neuman, Nenovision
14:00 - 14:30 Benefits of AFM-in-SEM for applications in material science and battery research, Dr. Jan Neuman, NenoVision
14.30 – 15.00 Guided tour around MIT.nano, Dr. Anna Osherov
15:00 – 16.00 Open discussion
Read more and register