All Events

Raith VELION FIB-SEM user meeting—Dec. 3

During this meeting, taking place at MIT.nano, users of the VELION focused ion beam scanning electron microscope (FIB-SEM) will hear from Raith staff, present research updates, and have the opportunity to share input, ideas, and feedback.

Friday, December 3
10 AM – 12:30 PM ET

MIT / Dow Innovation Day—Dec. 2

The School of Engineering and the Climate & Sustainability Consortium (MCSC) are co-hosting a seminar for the MIT community featuring A.N. Sreeram, Chief Technology Officer for Dow. He will be discussing upcoming innovations at Dow, and how to implement rigorous engineering and science-based scalable solutions for the world’s greatest challenges. 

12:15 - 1:45 p.m. 
E14-674; Boxed lunch will be served
RSVP here.